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Author

Xiao-Wei Li

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Conference Aug 2026

HEARS: High-Fidelity Emulation for Aging Fault via Scan-Chain Reuse and Flip-Flop Sampling

As semiconductor nodes shrink to 7nm and below, aging-induced delay faults (e.g., NBTI, HCI) increasingly threaten SoC reliability. To optimize resilience, designers require early-stage evaluation of fault impacts; however, traditional Fault Injection (FI) assessments are either bottlenecked by the slow execution of pr...

Zhi-Teng Chao, Jia-Tong Chang, Jie Yu et al. · 0 citations
Jul 2026

An Efficient Fault-Tolerance Scheme for CKKS Computation on CPUs

This work presents an efficient fault-tolerance scheme for CPU-based CKKS computation that achieves a 100 percent empirical detection rate across 150,000 non-crashing corrupted-result cases and maintains application accuracy close to the fault-free baseline over a wide range of fault rates.

Jia-Nan Mu, Ge Yu, Tenghui Hua et al. · 0 citations

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