Aug 2026· Bulletin of Electrical Engineering and Informatics· Vol 15, pp. 3070-3079· 0 citations· 28 references
TL;DR
The proposed real-time PCB defect detection model based on a Transformer decoder-only architecture’s efficiency and high precision make it well suited for deployment in fast-paced PCB manufacturing lines that demand stringent real-time performance and reliable defect detection.
Abstract
Printed circuit boards (PCBs) are critical components in modern electronics, detecting defects rapidly, and accurately is crucial in manufacturing. We propose a novel real-time PCB defect detection model based on a Transformer decoder-only architecture. The framework first extracts multi-scale features via a backbone with a feature pyramid network (FPN) and generates candidate regions using a region proposal network (RPN). These region proposals are encoded as query embeddings that drive an adaptive multi-scale deformable attention (AMDA) module in the Transformer decoder, replacing the standard encoder-decoder attention. By dynamically weighting multi-scale feature maps for each query, AMDA emphasizes the feature scale most relevant to each defect’s size and texture, and yielding enhanced discriminative representations for subtle defect detection. The decoder-only design drastically reduces computational overhead compared to full encoder-decoder Transformers, enabling real-time inference, and faster training convergence. Experiments on benchmark PCB defect datasets demonstrate that our approach outperforms state-of-the-art methods in both accuracy and speed. The proposed model’s efficiency and high precision make it well suited for deployment in fast-paced PCB manufacturing lines that demand stringent real-time performance and reliable defect detection.
PCBs are required in the final products of electronic manufacturing, and quality inspection must be carried out. Uncorrected surface defects may persist through subsequent production stages and degrade device performance. Convolutional Neural Networks (CNNs) have been widely applied to PCB defect detection because of t...
Ran-Ting Zhang, Huan-Huan Lian, Ying-Min Li et al.· International Conference on...· 0 citations
Automatic defect detection for printed circuit boards (PCBs) is crucial for manufacturing quality and reliability, yet remains challenging due to tiny defect sizes, low visual contrast, and deployment constraints. We propose SHNet, a lightweight YOLOv8s-based detector that emphasizes shallow high-resolution representat...
Accurate detection of small and low-contrast printed circuit board (PCB) defects remains challenging. To address this problem, we propose SDL-YOLO, a YOLO11n-based detector designed to improve small-defect representation while controlling computational cost. A Detection-Optimized Sparse Mixture-of-Experts (DS-MOE) modu...
Hua-Ying Li, Huan Li, M. Alam· IEEE Access· 0 citations
It is challenging to detect tiny surface defects on printed circuit boards (PCBs) due to their small size, elongated features, and the complex textured background. This paper develops Lightweight Edge-guided YOLO(LE-YOLO), a lightweight detector based on YOLOv8n. First, a lightweight cross-layer output reconstruction s...
Guang-Guang Yang, Yu-Cheng Yu, Si-Cheng Wan et al.· 2026 2nd International Confe...· 0 citations
Accurate wafer defect detection is critical for yield improvement in semiconductor manufacturing and package testing. Conventional CNN-based and Transformer-based detectors struggle to localize small defects and capture global context in low-resolution images with extreme scale variation. In this paper, we propose FGC-...
Rui Chen, Bing Long, Zhi-Jian Dai et al.· International Test Conferenc...· 0 citations
The proposed ensemble attention convolutional neural network (EACNN) first performs binary defect detection to distinguish between defective and non-defective samples, followed by a dedicated defect-type classification for fine-grained categorization that underscores EACNN’s ability to learn highly discriminative featu...
Uzma Batool, Zahid Iqbal, M. I. Shapiai et al.· PeerJ Computer Science· 1 citation
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