Industrial visual sensing systems play a critical role in automated quality inspection. However, deploying data-driven perception models on industrial visual sensors faces significant bottlenecks due to the extreme scarcity of annotated anomaly samples and the pronounced long-tailed distribution of defect types. These factors render traditional supervised models prone to overfitting and catastrophic failure when sensing rare anomalies. To address these limitations in the sensor data processing pipeline, this article proposes a novel few-shot perception framework leveraging multimodal large language models (MLLMs) as a cognitive backend, without task-specific fine-tuning of the sensing model. Our approach introduces two key innovations: 1) a vision-text paired in-context learning (VTP-ICL) mechanism that constructs structured multimodal prompts to activate pretrained knowledge for precise defect localization and 2) a two-stage reflection pipeline that decouples initial prediction from verification, enabling the model to self-correct outputs based on explicit criteria. Extensive experiments on a real-world industrial fabric dataset demonstrate that our method achieves state-of-the-art performance under strict few-shot conditions (two shots per class). Notably, our approach maintains an exceptional balance between precision and recall, significantly outperforming traditional detectors, particularly on hard-to-sense, low-contrast defects. These results validate the potential of MLLMs as robust and generalizable engines for next-generation industrial sensing applications.
This work proposes ElainaCLIP, a prompt learning framework based on CLIP to incorporate vision-guided information into text prompt representations and introduce ElainaLoss to guide prompt learning through low-level semantic constraints, thereby enhancing the modeling of unstructured anomaly semantics.
Chun-Lei Wu, Yong-Hao Wang, Bai Qiao et al.· Multimedia Systems· 0 citations
Zero-shot industrial anomaly detection (ZIAD) aims to develop a unified model capable of directly identifying unseen anomaly categories in images without requiring reference samples. Recently, large-scale Vision-Language Models (VLMs) such as CLIP have shown great potential for solving this task. However, existing meth...
Tiyu Fang, Lin Zhang, Ran Song et al.· IEEE Transactions on Automat...· 0 citations
Automated optical inspection is crucial for maintaining quality in modern manufacturing. While deep-learning-based anomaly detection (AD) has shown promise, its deployment is often hindered by “contextual variations,” namely benign environmental changes such as lighting or camera noise that are irrelevant to product de...
Kota Dohi, Naoya Takeishi, T. Yairi· IEEE Access· 1 citation
The results show that existing evaluation masks can act as practical training signals that measurably and reproducibly improve where defect classifiers attend, and contextualizing the supervised gains.
Most industrial defect segmentation methods rely on extensive pixel-level annotations and are limited to known defect categories and domains. To address this limitation, this paper investigates cross-domain few-shot defect segmentation, where meta-knowledge learned from a data-rich source domain is transferred to unsee...
Bao-Jia Shao, Dexing Shan· 2026 3rd International Confe...· 0 citations
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